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# ADI's Front-End

- **Company:** Analog Devices
- **Location:** Camas, United States
- **Experience:** Experienced
- **Salary:** $75,200.0 - $103,400.0
- **Contract:** Permanent contract
- **Skills:** Data Analysis, Analysis of Variance (ANOVA), IBM WebSphere DataPower SOA Appliances, Statistical Process Control (SPC), JMP (Statistical Software)
- **Published:** August 21, 2026
- **Apply:** https://www.dice.com/job-detail/96fe5890-cd60-4142-9621-a5750275a887

## About the Role

* B.S. or M.S. in Electrical Engineering, Electronics Engineering, Chemical Engineering, Materials Science, Device Physics, or related technical field.
 * 2+ years of experience driving defect reduction and yield enhancement in CMOS/BiCMOS or bipolar technologies and semiconductor unit processes.
 * Strong communication skills (written, verbal, presentation).
 * Strong analytical/problem-solving skills; able to make decisions using data.
 * Ability to drive projects to closure while managing shifting priorities.
 * Statistical analysis experience (t-test, ANOVA) and familiarity with JMP (or similar statistical software).

Preferred qualifications

 * Experience with defect inspection and review tools (e.g., KLA/ONTO bright field, dark field, Automated SEM review or similar tool set).
 * Experience analyzing defect-to-sort correlation, yield kill ratios, and spatial signatures using tools such as KLARITY ACE, KLARITY Defect, or PDF DataPower or similar analysis software.

## Description

ADI's Front-End Fab Quality organization drives customer satisfaction through continuous improvement in front-end manufacturing, with a focus on defect reduction, prevention, and yield enhancement. This role is based at ADI's wafer fabrication facility in Camas, Washington, and works cross-functionally to identify, contain, and eliminate yield-limiting defect mechanisms., * Defect control ownership: Own defect control across multiple semiconductor process flows; monitor SPC trends, run correlation/commonality analysis, and support timely corrective actions to prevent inline excursions.

 * Excursion response support: Support defect excursion investigations, including data pull/analysis, containment documentation, and disposition support for discrepant material.
 * Defect reduction execution: Support clear goals for yield-limiting defect types; execute initiatives using Pareto and yield kill ratio analysis; help build and maintain out-of-control action plans (OCAPs).
 * Metrology tool support: Support defect inspection and SEM review tool performance (recipe robustness, matching checks, monitoring plans) across darkfield/brightfield Automated Optical Inspection (AOI) and SEM review platforms.
 * Cross-functional problem solving: Collaborate with Integration, Process, Equipment, and Operations teams to plan and execute experiments, perform segmentation/spatial signature analysis, summarize results, and propose actionable process optimizations.
 * Data analysis and reporting: Analyze defect and yield data using KLARITY ACE Defect or similar software; communicate findings through clear written updates and presentations.
 * Best practices and knowledge sharing: Learn and apply best-known methods (BKMs), and share learnings with peers and technicians as part of project execution.


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