> Markdown version of [/jobs/ext/3195381-design-for-test-lead](https://www.wearedevelopers.com/jobs/ext/3195381-design-for-test-lead). Every page supports `.md` or `Accept: text/markdown`. Links point to the HTML versions so they work for humans too. Agent guide: [/agents.md](https://www.wearedevelopers.com/agents.md). --- # Design for Test Lead - **Company:** Neurophos Inc. - **Location:** Austin, TX, United States - **Experience:** Expert - **Salary:** $225,000.0 - $300,000.0 - **Contract:** Permanent contract - **Skills:** Analog Electronics, Code Coverage, Joint Test Action (IEEE Standards), System Testing, Application Specific Integrated Circuits, Power Analysis (Cryptography), Physical Design - **Published:** September 17, 2026 - **Apply:** https://www.indeed.com/viewjob?jk=f1be2339a42d0266 ## About the Role * 8 to 15 years in DFT, with hands-on ownership of scan, ATPG, and MBIST. * Architect-level experience on a large digital ASIC: you've assessed a full chip, set the DFT strategy, and owned coverage signoff. * Experience developing and specifying functional test vectors to augment structural coverage. * Track record through tapeout on a complex compute ASIC. Preferred Skills * Analog test specification experience: defining what it takes to test analog circuits and working that out directly with the analog team. * Cadence toolchain experience * Exposure to silicon photonics test or design-for-test for photonic components. * Experience using AI tooling in DFT flows. ## Description We're hiring a DFT Architect to own design-for-test for our electronic IC. You'll set the DFT strategy for the full chip, own coverage assessment and signoff, and work with the RTL and physical design teams to build testability in from the start. This is our first dedicated DFT hire, so you'll define how test gets done here and grow the team that executes it, working directly with the analog team on their test requirements and owning the handoff into the post-silicon test program., * Own DFT architecture and test control design for multiple ASIC devices using ATPG scan (stuck-at/at-speed), MBIST, and boundary scan / JTAG. Architecture to include MCM and external HBM memory module DFT capabilities as well. * Architect on-die memory test, including controller specification and generation, pattern selection, RAM grouping and system test time and power analysis. * Work with operations and PE teams to ensure all test modes are fully implemented, including HAST and other product qualification functions. * Architect system level wafer and package level DFT plans for all phases of the product development process. * Create and deploy integrated DFT development flow with critical metrics allowing quick analysis and updates to achieve near 100% test coverage. * Own coverage assessment and signoff, including where to accept a coverage gap and the reasoning behind it. * Develop and specify functional test vectors to augment structural coverage. * Specify analog test requirements to the analog team, including self-test and loopback approaches. * Build testability into RTL and implementation early, partnering with the RTL and physical design teams. * Own handoff to the post-silicon test program, working with operations and package teams on where system-level validation picks up. * Own delivery and deployment of production level test plan to OSAT